发明名称 Methods for atomic layer deposition of hafnium-containing high-K dielectric materials
摘要 Embodiments of the invention provide methods for depositing materials on substrates during vapor deposition processes, such as atomic layer deposition (ALD). In one embodiment, a chamber contains a substrate support with a receiving surface and a chamber lid containing an expanding channel formed within a thermally insulating material. The chamber further includes at least one conduit coupled to a gas inlet within the expanding channel and positioned to provide a gas flow through the expanding channel in a circular direction, such as a vortex, a helix, a spiral, or derivatives thereof. The expanding channel may be formed directly within the chamber lid or formed within a funnel liner attached thereon. The chamber may contain a retaining ring, an upper process liner, a lower process liner or a slip valve liner. Liners usually have a polished surface finish and contain a thermally insulating material such as fused quartz or ceramic. In an alternative embodiment, a deposition system contains a catalytic water vapor generator connected to an ALD chamber.
申请公布号 US8282992(B2) 申请公布日期 2012.10.09
申请号 US20070925681 申请日期 2007.10.26
申请人 MYO NYI OO;CHO KENRIC;KHER SHREYAS;NARWANKAR PRAVIN;POPPE STEVE;METZNER CRAIG R.;DEATEN PAUL;APPLIED MATERIALS, INC. 发明人 MYO NYI OO;CHO KENRIC;KHER SHREYAS;NARWANKAR PRAVIN;POPPE STEVE;METZNER CRAIG R.;DEATEN PAUL
分类号 C23C16/00;C23C16/02;C23C16/40;C23C16/44;C23C16/448;C23C16/455;C23C16/56;F22B1/00 主分类号 C23C16/00
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