发明名称 Fabrication of through-silicon vias on silicon wafers
摘要 A through-silicon via fabrication method comprises forming a substrate by bonding the front surface of a silicon plate to a carrier using an adhesive layer therebetween to expose the back surface of the silicon plate. A silicon nitride passivation layer is deposited on the exposed back surface of the silicon plate of the substrate. A plurality of through holes are etched in the silicon plate, the through holes comprising sidewalls and bottom walls. A metallic conductor is deposited in the through holes to form a plurality of through-silicon vias.
申请公布号 US8283237(B2) 申请公布日期 2012.10.09
申请号 US20100978129 申请日期 2010.12.23
申请人 RAJAGOPALAN NAGARAJAN;PARK JI AE;YAMASE RYAN;PATEL SHAMIK;NOWAK THOMAS;XIA LI-QUN;KIM BOK HOEN;DING RAN;BALDINO JIM;NAIK MEHUL;RAMASWAMI SESH;APPLIED MATERIALS, INC. 发明人 RAJAGOPALAN NAGARAJAN;PARK JI AE;YAMASE RYAN;PATEL SHAMIK;NOWAK THOMAS;XIA LI-QUN;KIM BOK HOEN;DING RAN;BALDINO JIM;NAIK MEHUL;RAMASWAMI SESH
分类号 H01L21/30;H01L21/31;H01L21/44;H01L21/4763 主分类号 H01L21/30
代理机构 代理人
主权项
地址