发明名称 |
OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE: An oxide semiconductor film and a semiconductor device are provided to improve the reliability of the semiconductor device by using the oxide semiconductor film comprising indium zinc oxide for a transistor. CONSTITUTION: An oxide semiconductor film is composed of indium zinc oxide. The oxide semiconductor film includes a hexagonal crystal structure. A first insulating film is provided between a gate electrode and the oxide semiconductor film. A source electrode and a drain electrode are contacted to the oxide semiconductor film. A second insulating film is formed on the oxide semiconductor film.</p> |
申请公布号 |
KR20120109350(A) |
申请公布日期 |
2012.10.08 |
申请号 |
KR20120029208 |
申请日期 |
2012.03.22 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
HONDA TATSUYA;KANEMURA HIROSHI;AKIMOTO KENGO;HIRAISHI SUZUNOSUKE |
分类号 |
H01L29/04;H01L21/336;H01L29/786 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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