发明名称 OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: An oxide semiconductor film and a semiconductor device are provided to improve the reliability of the semiconductor device by using the oxide semiconductor film comprising indium zinc oxide for a transistor. CONSTITUTION: An oxide semiconductor film is composed of indium zinc oxide. The oxide semiconductor film includes a hexagonal crystal structure. A first insulating film is provided between a gate electrode and the oxide semiconductor film. A source electrode and a drain electrode are contacted to the oxide semiconductor film. A second insulating film is formed on the oxide semiconductor film.</p>
申请公布号 KR20120109350(A) 申请公布日期 2012.10.08
申请号 KR20120029208 申请日期 2012.03.22
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 HONDA TATSUYA;KANEMURA HIROSHI;AKIMOTO KENGO;HIRAISHI SUZUNOSUKE
分类号 H01L29/04;H01L21/336;H01L29/786 主分类号 H01L29/04
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