发明名称 METHOD OF ACCELERATING WRITE TIMING CALIBRATION AND WRITE TIMING CALIBRATION ACCELERATION CIRCUIT IN SEMICONDUCTOR MEMORY DEVICE
摘要 A method of accelerating write timing calibration and a write timing calibration acceleration circuit in a semiconductor memory device are disclosed. The write timing calibration acceleration circuit includes a phase difference detection unit and a detection data output unit. The phase difference detection unit detects a phase difference between a first signal and a second signal applied for a write timing calibration. The detection data output unit outputs detection data corresponding to the detected phase difference through a data output line. According to the write timing calibration acceleration circuit of the inventive concept, a time taken to perform a write timing calibration is reduced, thereby minimizing boot up time and power consumption.
申请公布号 US2012250434(A1) 申请公布日期 2012.10.04
申请号 US201213435333 申请日期 2012.03.30
申请人 SONG WON-HYUNG;SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG WON-HYUNG
分类号 G11C8/18;G11C7/00 主分类号 G11C8/18
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