SPECIMEN GRID HOLDER AND FOCUSED ION BEAM SYSTEM OR DUAL BEAM SYSTEM HAVING THE SAME

摘要

A specimen grid holder includes a base and two holding members disposed thereon. Each holding member has at least one inserting portion and at least one holding portion formed adjacently. The specimen grid can be inserted into the inserting portion and moved to the holding portion for securement. The two holding members can be used to secure specimens at different orientations for analyses.