IC CHIP, SEMICONDUCTOR COMPONENT, TEST PROBE, HANDY MULTI-TESTER, AND COMMUNICATION DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an IC chip allowing a TDR test in a low-cost configuration.

SOLUTION: An IC chip for a TDR (Time Domain Reflectometry) test comprises: a clock generation part for generating a clock signal; a pulse generation part for generating a pulse using the clock signal as a trigger and outputting it to a test target; a multiplication part for multiplying the clock signal to generate a multiplied clock signal; an A/D converter for performing an A/D conversion of a reflection signal from the test target in synchronization with the multiplied clock signal and sampling it as reflection data; a memory for storing the sampled reflection data; and a communication control part for receiving a readout command from the outside and outputting the reflection data stored in the memory to the outside according to the readout command.

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