发明名称 SILICON NITRIDE FILM DEPOSITION METHOD, MANUFACTURING METHOD OF ORGANIC ELECTRONIC DEVICE, AND SILICON NITRIDE FILM DEPOSITION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To appropriately deposit a silicon nitride film on a substrate in low-temperature environment in which the temperature of the substrate is 100&deg;C or lower to improve film characteristic of the silicon nitride film. <P>SOLUTION: An anode layer 20, a light emitting layer 21, a cathode layer 22 and a silicon nitride film 23 are deposited in sequence on a glass substrate G, to manufacture an organic EL device A. The silicon nitride film 23 is deposited by supplying a processing gas containing a silane gas, a nitrogen gas and a hydrogen gas to a processing vessel of a plasma deposition apparatus, exciting the processing gas to generate plasma while maintaining the temperature of the substrate inside the processing vessel at 100&deg;C or lower and the pressure inside the processing vessel at 20-60 Pa, and applying plasma processing using the plasma. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012188735(A) 申请公布日期 2012.10.04
申请号 JP20110233620 申请日期 2011.10.25
申请人 TOKYO ELECTRON LTD 发明人 ISHIKAWA HIROSHI
分类号 C23C16/34;H01L51/50;H05B33/04;H05B33/10 主分类号 C23C16/34
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