摘要 |
<P>PROBLEM TO BE SOLVED: To carry out optical performance inspection with high accuracy on a far-infrared lens. <P>SOLUTION: A test chart 10 is provided with a platy chart board 12 having a rectangular measuring surface 11, and chart patterns 15 formed on the measuring surface 11. The chart patterns 15 are provided at a center 11x of the measuring surface 11 or four corners of the measuring surface 11. Each of the chart patterns 15 is composed of a linear pattern 15a, and a base pattern 15b adjacent to the linear pattern 15a. The linear pattern 15a is formed so as to extend in a vertical direction on the measuring surface 11 of the chart board 12. The emissivity εb of a far-infrared ray of a formation material of the chart board 12, and the emissivity εa of a far-infrared ray of a formation material of the linear pattern 15a are different. The test chart 10 is provided with a temperature adjusting portion 20 for adjusting the temperature of the chart board 12 and the linear pattern 15a. The temperature adjusting portion 20 makes the temperature of the chart board 12 and the temperature of the linear patten 15a uniform. <P>COPYRIGHT: (C)2013,JPO&INPIT |