PROJECTION APPARATUS, PROJECTION METHOD, AND PROGRAM STORING PROGRAM

摘要

A projection unit projects the optical image formed by the optical image formation unit toward a projection target. A temperature detection unit detects a temperature of each type of the semiconductor light emitting elements during light emission. A measurement unit measures an intensity of light from each type of the semiconductor light emitting elements during light emission. A light emission control unit (a) corrects a measurement result from the measurement unit using a detection result from the temperature detection unit and (b) controls the light emission intensity for each of the semiconductor light emitting elements based on the corrected measurement result.