发明名称 |
PLASMA ETCHING GAS AND PLASMA ETCHING METHOD |
摘要 |
<p>The present invention is an etching gas that contains an unsaturated fluorinated hydrocarbon represented by CxHyFz (x = 3, 4, or 5; y + z = 2 x; and y > z) and a method for selectively etching a silicon nitride film on a silicon oxide film or silicon film using this etching gas. According to the present invention, etching of the silicon nitride film laminated onto the silicon oxide film or silicon film can be carried out with high selectivity.</p> |
申请公布号 |
WO2012133401(A1) |
申请公布日期 |
2012.10.04 |
申请号 |
WO2012JP57921 |
申请日期 |
2012.03.27 |
申请人 |
ZEON CORPORATION;ITO AZUMI;YAMAZAKI ATSUYO |
发明人 |
ITO AZUMI;YAMAZAKI ATSUYO |
分类号 |
H01L21/3065;H01L21/28;H01L21/768 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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