发明名称 METHOD OF FORMING SEMICONDUCTOR STRUCTURE CONTAINING TiC FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of forming a semiconductor structure containing a TiC film. <P>SOLUTION: The method of forming a semiconductor structure includes: providing a stack, which comprises a high dielectric constant (k) dielectric 14 and an interfacial layer 12, on a surface of a substrate 10; and forming a TiC film 16 on the stack by sputtering with a Ti target in an atmosphere comprising Ar and a carbon (C) source that is diluted with He. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012191220(A) 申请公布日期 2012.10.04
申请号 JP20120108582 申请日期 2012.05.10
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 ALESSANDRO C CALLEGARI;MICHAEL A GRIBELYUK;DIANNE L LACEY;FENTON R MCFEELY;KATHERINE L SAENGER;SUFI ZAFAR
分类号 H01L29/78;C23C14/34;H01L21/28;H01L21/285;H01L21/336;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L29/78
代理机构 代理人
主权项
地址