发明名称 |
METHOD OF FORMING SEMICONDUCTOR STRUCTURE CONTAINING TiC FILM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of forming a semiconductor structure containing a TiC film. <P>SOLUTION: The method of forming a semiconductor structure includes: providing a stack, which comprises a high dielectric constant (k) dielectric 14 and an interfacial layer 12, on a surface of a substrate 10; and forming a TiC film 16 on the stack by sputtering with a Ti target in an atmosphere comprising Ar and a carbon (C) source that is diluted with He. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012191220(A) |
申请公布日期 |
2012.10.04 |
申请号 |
JP20120108582 |
申请日期 |
2012.05.10 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
ALESSANDRO C CALLEGARI;MICHAEL A GRIBELYUK;DIANNE L LACEY;FENTON R MCFEELY;KATHERINE L SAENGER;SUFI ZAFAR |
分类号 |
H01L29/78;C23C14/34;H01L21/28;H01L21/285;H01L21/336;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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