发明名称 TRANSFER MASK, METHOD OF MANUFACTURING A TRANSFER MASK, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 Provided is a transfer mask which has a transfer pattern formed in a pattern-forming thin film provided on a transparent substrate and is adapted to be applied with exposure light having a wavelength of 200 nm or less. The pattern-forming thin film is made of a material containing silicon an a transition metal other than chromium and the chromium content in the film is less than 1.0×1018 atoms/cm3.
申请公布号 US2012251931(A1) 申请公布日期 2012.10.04
申请号 US201013501348 申请日期 2010.10.08
申请人 HASHIMOTO MASAHIRO;SAKAI KAZUYA;SUZUKI TOSHIYUKI;ONO KAZUNORI;HOYA CORPORATION 发明人 HASHIMOTO MASAHIRO;SAKAI KAZUYA;SUZUKI TOSHIYUKI;ONO KAZUNORI
分类号 G03F1/00;G03F1/26;G03F1/32;G03F1/46;G03F1/54;G03F1/76;G03F1/82;G03F7/20 主分类号 G03F1/00
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