发明名称 |
PROFILE MEASURING APPARATUS, METHOD FOR MEASURING PROFILE, AND METHOD FOR MANUFACTURING STRUCTURE |
摘要 |
A profile measuring apparatus includes: an irradiating unit which is configured to irradiate the measuring object with light from the light source to form a spotted pattern; a scanner which is configured to relatively scan the surface of the measuring object with the spotted pattern; a light receiver which includes a plurality of light-receiving pixels aligned to detect an image of the spotted pattern generated by the light irradiating the measuring object from a different direction different from an irradiation direction of the light irradiating the measuring object; a changing unit which is configured to change positions, at which signals utilized to detect a position of the image of the spotted pattern are obtained, according to the irradiation direction of the light; and a controller which is configured to calculate positional information of the measuring object based on the signals from the light-receiving pixels.
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申请公布号 |
US2012246899(A1) |
申请公布日期 |
2012.10.04 |
申请号 |
US201213435147 |
申请日期 |
2012.03.30 |
申请人 |
YAMADA TOMOAKI;TANEMURA TAKASHI |
发明人 |
YAMADA TOMOAKI;TANEMURA TAKASHI |
分类号 |
G01B11/25;B23P6/00;B23P17/00 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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