发明名称 ALIGNMENT OF AN INTERFEROMETER MODULE FOR AN EXPOSURE TOOL
摘要 The invention relates to alignment of an interferometer module (60) for use in an exposure tool. An alignment method is provided for aligning an interferometer to the tool while outside of the tool. Furthermore, the invention provides a dual interferometer module, an alignment frame use in the alignment method, and an exposure tool provided with first mounting surfaces for cooperative engagement with second mounting surfaces (62, 63, 64) of an interferometer module.
申请公布号 WO2012134292(A1) 申请公布日期 2012.10.04
申请号 WO2012NL50211 申请日期 2012.03.30
申请人 MAPPER LITHOGRAPHY IP B.V.;DE BOER, GUIDO;OOMS, THOMAS ADRIAAN;VERGEER, NIELS;COUWELEERS, GODEFRIDUS CORNELIUS ANTONIUS 发明人 DE BOER, GUIDO;OOMS, THOMAS ADRIAAN;VERGEER, NIELS;COUWELEERS, GODEFRIDUS CORNELIUS ANTONIUS
分类号 G01B9/02;G03F7/20 主分类号 G01B9/02
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