发明名称 Inspection apparatus
摘要 The inspection apparatus includes a probe having a contact for contacting an electrode of an inspected object and having a built-in heater for correcting dislocation of the contact to the electrode caused by temperature difference between the probe and the inspected object; a tester for testing the probe and supplying electric power to the heater; an electric power supply, provided on the tester, for supplying electric power to the heater; and a temperature control unit for controlling electric power to the heater of the probe through the electric power supply, wherein the electric power supply includes at least one open/close switch for switching power to the heater on and off. A connector has a male connector and a female connector on opposing ends. A continuity-checking device checks supply of electric power to the heater from the electric power supply.
申请公布号 US8278965(B2) 申请公布日期 2012.10.02
申请号 US20100772557 申请日期 2010.05.03
申请人 WASHIO KENICHI;YASUTA KATSUO;OSHIMA TOSHIKAZU;HIRAI TAKEHIKO;KABUSHIKI KAISHA NIHON MICRONICS 发明人 WASHIO KENICHI;YASUTA KATSUO;OSHIMA TOSHIKAZU;HIRAI TAKEHIKO
分类号 G01R31/40 主分类号 G01R31/40
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