发明名称 LDD epitaxy for FinFETs
摘要 A method of forming a semiconductor structure includes providing a substrate including a fin at a surface of the substrate, and forming a fin field-effect transistor (FinFET), which further includes forming a gate stack on the fin; forming a thin spacer on a sidewall of the gate stack; and epitaxially growing a epitaxy region starting from the fin. After the step of epitaxially growing the epitaxy region, a main spacer is formed on an outer edge of the thin spacer. After the step of forming the main spacer, a deep source/drain implantation is performed to form a deep source/drain region for the FinFET.
申请公布号 US8278179(B2) 申请公布日期 2012.10.02
申请号 US20100720476 申请日期 2010.03.09
申请人 LIN DA-WEN;CHU CHE-MIN;LI TSUNG-HUNG;TSENG CHIH-HUNG;LIN YEN-CHUN;WU CHUNG-CHENG;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN DA-WEN;CHU CHE-MIN;LI TSUNG-HUNG;TSENG CHIH-HUNG;LIN YEN-CHUN;WU CHUNG-CHENG
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址