发明名称 Electrostatic discharge protection device
摘要 An electrostatic discharge protection device coupled between a first power line and a second power line is provided. A first N-type doped region is formed in a P-type well. A first P-type doped region is formed in the first N-type doped region. A second P-type doped region includes a first portion and a second portion. The first portion of the second P-type doped region is formed in the first N-type doped region. The second portion of the second P-type doped region is formed outside of the first N-type doped region. A second N-type doped region is formed in the first portion of the second P-type doped region. The first P-type doped region, the first N-type doped region, the second P-type doped region and the second N-type doped region constitute an insulated gate bipolar transistor (IGBT).
申请公布号 US8278736(B2) 申请公布日期 2012.10.02
申请号 US20100875217 申请日期 2010.09.03
申请人 JOU YEH-NING;HUNG CHIA-WEI;CHANG SHU-LING;CHIOU HWA-CHYI;HUANG YEH-JEN;VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 JOU YEH-NING;HUNG CHIA-WEI;CHANG SHU-LING;CHIOU HWA-CHYI;HUANG YEH-JEN
分类号 H01L29/739;H01L23/60 主分类号 H01L29/739
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