发明名称 Unit for opening insert for test tray and method of mounting semiconductor device using the same
摘要 A unit for opening an insert of a test tray which comprises an accommodating space for accommodating a semiconductor device and a support for supporting the semiconductor device accommodated in the accommodating space, the unit includes a body, a pair of opening devices provided in the body to open the insert, and a positioning guide unit protruding to be inserted into an accommodating space for a semiconductor device when opening the insert and supporting the semiconductor device that is transferred into the accommodating space to be spaced upward apart from a support provided in the accommodating space.
申请公布号 US8277162(B2) 申请公布日期 2012.10.02
申请号 US20090407454 申请日期 2009.03.19
申请人 NA YUN SUNG;KU TAE HUNG;HWANG JUNG WOO;TECHWING CO., LTD. 发明人 NA YUN SUNG;KU TAE HUNG;HWANG JUNG WOO
分类号 B65G1/00 主分类号 B65G1/00
代理机构 代理人
主权项
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