发明名称 Structure for improving die saw quality
摘要 A semiconductor device is provided that includes a semiconductor substrate, a plurality of dies formed on the semiconductor substrate, the plurality of dies being separated from one another by a first region extending along a first direction and a second region extending along a second direction different from the first direction, a dummy metal structure formed within a third region that includes a region defined by an intersection of the first region and the second region, a plurality of metal interconnection layers formed over the substrate, and a plurality of dielectric layers formed over the substrate. Each of the metal interconnection layers is disposed within each of the dielectric layers and a dielectric constant of at least one of the dielectric layers is less than about 2.6.
申请公布号 US8278737(B2) 申请公布日期 2012.10.02
申请号 US20090417394 申请日期 2009.04.02
申请人 CHEN HSIEN-WEI;TSAI HAO-YI;CHEN YING-JU;LIU YU-WEN;JENG SHIN-PUU;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN HSIEN-WEI;TSAI HAO-YI;CHEN YING-JU;LIU YU-WEN;JENG SHIN-PUU
分类号 H01L21/00 主分类号 H01L21/00
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