发明名称 CHEMICAL MECHANICAL POLISHING METHOD
摘要 A chemical mechanical polishing method includes providing a device layer having a surface to be polished, polishing the surface using an alkaline grinding slurry, removing a residual layer that is been formed on the polished surface using an acid buffer, forming a passivation layer covering the polished surface of the device layer after the residual layer has been removed, and cleaning the passivation layer using deionized water. A semiconductor device thus fabricated has surfaces with excellent flatness, good manufacturing yield and long-term reliability.
申请公布号 US2012244706(A1) 申请公布日期 2012.09.27
申请号 US201113253947 申请日期 2011.10.05
申请人 ZHAO FENG;DENG WUFENG;ZHAO JINGMIN;CHEN FENG;LIU CHUNLIANG;SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION 发明人 ZHAO FENG;DENG WUFENG;ZHAO JINGMIN;CHEN FENG;LIU CHUNLIANG
分类号 H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址