发明名称 DEFLECTION MIRROR AND PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY COMPRISING SUCH A DEFLECTION MIRROR
摘要 <p>The invention relates to a deflection mirror for a microlithography projection exposure apparatus for illuminating an object field in an object plane of the projection exposure apparatus using the deflection mirror with grazing incidence. Said deflection mirror consists of a substrate and at least one layer system, and during operation light impinges on said mirror at a multiplicity of angles of incidence, wherein the layer system is designed such that, for light having a wavelength of less than 30 nm, for an angle of incidence of between 55° and 70°, the variation of the reflectivity is less than 20%, in particular less than 12%.</p>
申请公布号 WO2012126867(A1) 申请公布日期 2012.09.27
申请号 WO2012EP54752 申请日期 2012.03.19
申请人 CARL ZEISS SMT GMBH;ENKISCH, HARTMUT;MUELLENDER, STEPHAN;ENDRES, MARTIN 发明人 ENKISCH, HARTMUT;MUELLENDER, STEPHAN;ENDRES, MARTIN
分类号 G02B17/06;G21K1/06 主分类号 G02B17/06
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