SECURITY TEST SUPPORT DEVICE, SECURITY TEST SUPPORT METHOD, AND SECURITY TEST SUPPORT PROGRAM

摘要

PROBLEM TO BE SOLVED: To generate test items for performing a security test without manufacturing an IC in which a program is written.

SOLUTION: A parameter DB (bypass) 15 and a parameter DB (alteration) 16 store parameters that are used for a test to be executed for a program that is before being written in an IC card, based on a result generated in the IC card by a physical attack to the IC card. A test item generation section 17 generates test items to be executed for the program based on the parameters stored in the parameter DB (bypass) 15 and the parameter DB (alteration) 16.

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