APPARATUS, SYSTEM AND METHOD FOR SCANNING MONOCHROMATOR AND DIODE ARRAY SPECTROMETER INSTRUMENTATION

摘要

A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.