发明名称 EDGE ROUNDED FIELD EFFECT TRANSISTORS AND METHODS OF MANUFACTURING
摘要 Embodiments of the present technology are directed toward gate sidcwall engineering of field effect transistors. The techniques include formation of a blocking dielectric region and nitridation of a surface thereof. After nitridation of the blocking dielectric region, a gate region is formed thereon and the sidewails of the gate region are oxidized to round off gate sharp corners and reduce the electrical field at the gate comers.
申请公布号 WO2012087978(A3) 申请公布日期 2012.09.27
申请号 WO2011US65930 申请日期 2011.12.19
申请人 SPANSION LLC;FANG, SHENQING;CHEN, TUNG-SHENG 发明人 FANG, SHENQING;CHEN, TUNG-SHENG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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