发明名称 FIN FIELD-EFFECT TRANSISTOR STRUCTURE AND MANUFACTURING PROCESS THEREOF
摘要 A fin field-effect transistor structure includes a substrate, a fin channel and a high-k metal gate. The high-k metal gate is formed on the substrate and the fin channel. A process of manufacturing the fin field-effect transistor structure includes the following steps. Firstly, a polysilicon pseudo gate structure is formed on the substrate and a surface of the fin channel. By using the polysilicon pseudo gate structure as a mask, a source/drain region is formed in the fin channel. After the polysilicon pseudo gate structure is removed, a high-k dielectric layer and a metal gate layer are successively formed. Afterwards, a planarization process is performed on the substrate having the metal gate layer until the first dielectric layer is exposed, so that a high-k metal gate is produced.
申请公布号 US2012241863(A1) 申请公布日期 2012.09.27
申请号 US201113052338 申请日期 2011.03.21
申请人 TSAI TENG-CHUN;WU CHUN-YUAN;LIN CHIN-FU;LIU CHIH-CHIEN;CHIEN CHIN-CHENG;UNITED MICROELECTRONICS CORP. 发明人 TSAI TENG-CHUN;WU CHUN-YUAN;LIN CHIN-FU;LIU CHIH-CHIEN;CHIEN CHIN-CHENG
分类号 H01L29/772;H01L21/336 主分类号 H01L29/772
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