发明名称 TEST APPARATUS FOR PCI CARD
摘要 A test apparatus includes a circuit board and a peripheral component interconnect (PCI) expansion slot. A number of golden fingers are arranged at a first side of the circuit board. A second side of the circuit board is connected to a bottom of the PCI expansion slot. The golden fingers are electrically connected to the PCI expansion slot. A number of first test pads and second test pads are arranged on the circuit board between the first and second sides. The first and second test pads have different shapes, sizes, and/or colors. The first and second test pads are electrically connected to the PCI expansion slot correspondingly.
申请公布号 US2012246371(A1) 申请公布日期 2012.09.27
申请号 US201113097105 申请日期 2011.04.29
申请人 FU XIAO-WEI;KANG ZE-KUN;CHEN YAN;YUE HUA;WANG TAI-CHEN;LIU XUE-HONG;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD 发明人 FU XIAO-WEI;KANG ZE-KUN;CHEN YAN;YUE HUA;WANG TAI-CHEN;LIU XUE-HONG
分类号 G06F13/00 主分类号 G06F13/00
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