发明名称 METHODS OF FABRICATING SEMICONDUCTOR DEVICES
摘要 A substrate including an NMOS transistor region and a PMOS transistor region is prepared. A silicon-germanium layer is formed on the PMOS transistor region. Nitrogen atoms are injected in an upper portion of the silicon-germanium layer. A first gate dielectric layer is formed on the NMOS transistor region and the PMOS transistor region. The nitrogen atoms are injected into the upper portion of the silicon-germanium layer before forming the first gate dielectric layer.
申请公布号 US2012244670(A1) 申请公布日期 2012.09.27
申请号 US201213423748 申请日期 2012.03.19
申请人 DO JINHO;LIM HAJIN;KIM WEONHONG;HONG KYUNGIL;SONG MOONKYUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 DO JINHO;LIM HAJIN;KIM WEONHONG;HONG KYUNGIL;SONG MOONKYUN
分类号 H01L21/8238;H01L21/336 主分类号 H01L21/8238
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