发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor device including a first insulating film formed above a semiconductor substrate and having a first relative dielectric constant; a second insulating film formed above the first insulating film and having a second relative dielectric constant greater than the first relative dielectric constant; a plurality of columnar plugs extending longitudinally through the first and the second insulating films having a first sidewall extending through the first insulating film and a second sidewall extending through the second insulating film, wherein the second sidewall is tapered; a third insulating film formed above the second insulating film and having a third relative dielectric constant less than the second relative dielectric constant of the second insulating film; trenches extending through the third insulating film and reaching an upper portion of the plugs; and an interconnect wiring comprising metal formed within the trenches and contacting the upper portion of the plugs.
申请公布号 US2012241978(A1) 申请公布日期 2012.09.27
申请号 US201213425730 申请日期 2012.03.21
申请人 MINO AKIRA;KABUSHIKI KAISHA TOSHIBA 发明人 MINO AKIRA
分类号 H01L23/535;H01L21/768 主分类号 H01L23/535
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