发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which high-quality crystals are formed on a substrate formed of silicon, for example. <P>SOLUTION: According to an embodiment, there is provided a semiconductor device comprising: an underground layer containing GaN, a function part including a nitride semiconductor, and an intermediate layer provided between the underground layer and the function part and including a layer containing AlN. A concentration of silicon atoms in a first region, which is included in the underground layer on a side opposite to the intermediate layer, is higher than a concentration of silicon atoms in a second region, which is included in the underground layer on a side opposite to the intermediate layer. A first surface, which is included in the ground layer on a side opposite to the intermediate layer, includes a plurality of concave portions. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012186449(A) 申请公布日期 2012.09.27
申请号 JP20120006495 申请日期 2012.01.16
申请人 TOSHIBA CORP 发明人 SHIODA MICHIYA;SUGIYAMA NAOJI;NUNOUE SHINYA
分类号 H01L21/20;H01L21/338;H01L29/778;H01L29/812;H01L33/32 主分类号 H01L21/20
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