发明名称 TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD
摘要 A temperature measuring apparatus and a temperature measuring method that may simultaneously measure temperatures of objects in processing chambers. The temperature measuring apparatus includes a first light separating unit which divides light from the light source into measurement lights; second light separating units which divide the measurement lights from the first light separating unit into measurement lights and reference lights; third light separating units which further divide the measurement lights into first to n-th measurement lights; a reference light reflecting unit which reflects the reference lights; an light path length changing unit which changes light path lengths of the reference lights reflected by the reference light reflecting unit; and photodetectors which measure interference between the first to n-th measurement lights reflected by the objects to be measured and the reference lights reflected by the reference light reflecting unit.
申请公布号 US2012243572(A1) 申请公布日期 2012.09.27
申请号 US201213428198 申请日期 2012.03.23
申请人 MATSUDO TATSUO;KOSHIMIZU CHISHIO;TOKYO ELECTRON LIMITED 发明人 MATSUDO TATSUO;KOSHIMIZU CHISHIO
分类号 G01K11/32 主分类号 G01K11/32
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