发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device having excellent electric characteristics and a method for manufacturing the semiconductor device are provided. A method for manufacturing a semiconductor device includes the steps of: forming a gate electrode; forming a gate insulating film to cover the gate electrode; forming an oxide semiconductor film over the gate insulating film; forming a hydrogen permeable film over the oxide semiconductor film; forming a hydrogen capture film over the hydrogen permeable film; performing heat treatment to release hydrogen from the oxide semiconductor film; forming a source electrode and a drain electrode to be in contact with a part of the oxide semiconductor film; and removing an exposed portion of the hydrogen capture film to form a channel protective film formed of the hydrogen permeable film. A semiconductor device manufactured by the above method is also provided.
申请公布号 US2012241738(A1) 申请公布日期 2012.09.27
申请号 US201213422251 申请日期 2012.03.16
申请人 IMOTO YUKI;MARUYAMA TETSUNORI;ENDO YUTA;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 IMOTO YUKI;MARUYAMA TETSUNORI;ENDO YUTA
分类号 H01L29/786;H01L21/36 主分类号 H01L29/786
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