发明名称 |
METHOD AND APPARATUS FOR MEASURING 3D HEIGHT INFORMATION OF MEASURED OBJECT |
摘要 |
PURPOSE: A method and a device for measuring 3D height information of a measurement object are provided to measure 3D height information of a measurement object from one photographing data. CONSTITUTION: A method for measuring 3D height information of a measurement object is as follows. Lights penetrated through a lattice are irradiated on a measurement object(S40). The lights reflected by a surface of the measurement object are photographed(S41). The photographing data of one photograph is signal-processed by a signal processing method of a digital holographic microscope technique so that a phase change amount according to the measurement object is calculated(S46). The height information of the measurement object based on the phase change amount(S47). [Reference numerals] (AA) Start; (BB) Finish; (S400) Irradiating lights penetrated through a lattice on a measurement object; (S41) Photographing; (S42) Converting a frequency region; (S43) Eliminating background light components/conjugation components; (S44) Extracting phase change amount components; (S45) Extracting phase change data; (S46) Calculating phase change amount; (S47) Calculating height information
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申请公布号 |
KR101186103(B1) |
申请公布日期 |
2012.09.27 |
申请号 |
KR20120010179 |
申请日期 |
2012.02.01 |
申请人 |
PEMTRON CO., LTD. |
发明人 |
KO, YOUNG JUNE;CHO, CHEOL HOON;YOO, YOUNG WOONG |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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