发明名称 X-RAY FOREIGN MATTER DETECTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray foreign matter detector capable of performing accurate foreign matter detection by starting to detect foreign matter in an inspection object without influence of a residue. <P>SOLUTION: An X-ray foreign matter detector 1 irradiates an inspection object conveyed by conveying means 3 with an X-ray, and detects foreign matter mixed into the inspection object based on its X-ray transmission amount. The detector includes a concentration level monitor 8a which monitors a change of a concentration level caused by the X-ray transmission amount and which indicates a start of detecting the foreign matter in the inspection object when the change of the concentration level stabilizes. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012185069(A) 申请公布日期 2012.09.27
申请号 JP20110049150 申请日期 2011.03.07
申请人 ANRITSU SANKI SYSTEM CO LTD 发明人 YAGI MASAHIRO
分类号 G01N23/04 主分类号 G01N23/04
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