发明名称 VACUUM INTEGRATED SUBSTRATE PROCESSING APPARATUS AND FILM DEPOSITION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide: a vacuum integrated substrate processing apparatus for solving a problem of air exposure after release etching, for example, for fabricating a MEMS device; and a film deposition method. <P>SOLUTION: A vacuum integrated substrate processing apparatus includes: a polygonal conveyance chamber 11; and a release etching apparatus 12, an ALD apparatus 13, a load lock chamber 18 and the like, which are connected to each side of the polygon, respectively. Release etching and ALD deposition are performed in vacuum integrated process. Thus, electrical characteristics and optical characteristics in a device finally obtained is improved and the production yield of a display can be also improved. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012184481(A) 申请公布日期 2012.09.27
申请号 JP20110049615 申请日期 2011.03.07
申请人 ULVAC JAPAN LTD 发明人 OMORI MIKI;SUZUKI MINORU;HONDA KAZUHIRO;ZAMA HIDEAKI;KUBO MASASHI
分类号 C23C16/44;C23C16/02;C23C16/40;H01L21/302;H01L21/31;H01L21/316;H01L21/677 主分类号 C23C16/44
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