| 摘要 |
<P>PROBLEM TO BE SOLVED: To obtain an encoder analysis apparatus which is capable of improving accuracy in detecting the presence/absence of abnormality relating to a foreign substance or flaw in an encoder to be tested. <P>SOLUTION: An encoder analysis apparatus comprises an encoder to be tested which detects a position of a device including a rotor or a mobile, a reference encoder which is coupled through the device to the encoder to be tested and detects the position of the device, a sampling unit which concurrently samples a position signal detected by the encoder to be tested and a position signal detected by the reference encoder, a generation unit which takes a differential between the sampled position signal by the encoder to be tested and the sampled position signal by the reference encoder to generate an error waveform of the position signals, an extraction unit which extracts a component waveform of a frequency band relating to a foreign substance or a flaw from the generated error waveform, and a determination unit which uses the extracted component waveform to determine the presence/absence of abnormality relating to the foreign substance or the flaw in the encoder to be tested. <P>COPYRIGHT: (C)2012,JPO&INPIT |
