| 摘要 |
Provided is a test apparatus that tests a device under test, comprising a test unit that sends and receives signals to and from the device under test; and a control apparatus that controls the test unit. The control apparatus includes a first buffer and a second buffer that buffer access requests to the test unit; a data output section that buffers, in the first buffer, access requests to be sent from the control apparatus to the test unit and, when an error occurs, buffers the access requests in the second buffer instead of the first buffer; and a transmitting section that sequentially transmits the access requests in the first buffer to the test unit and, when an error occurs, sequentially transmits the access requests in the second buffer to the test unit. |
