发明名称 Semiconductor memory apparatus and method of testing the same
摘要 A semiconductor memory apparatus includes a sense amplifier coupled to a plurality of bit lines, a switching unit configured to cause the plurality of bit lines to be coupled to a first node in response to a switching signal, a mode selecting unit configured to selectively couple the first node to a pad or a ground terminal in response to a mode selection signal and a testing unit configured to supply current to the pad during a test mode.
申请公布号 US8274852(B2) 申请公布日期 2012.09.25
申请号 US20090494511 申请日期 2009.06.30
申请人 KIM YOUNG SOO;HYNIX SEMICONDUCTOR INC. 发明人 KIM YOUNG SOO
分类号 G11C7/00;G11C29/00 主分类号 G11C7/00
代理机构 代理人
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