发明名称 |
PATTERNING PROCESS AND COMPOSITION FOR FORMING SILICON-CONTAINING FILM USABLE THEREFOR |
摘要 |
PURPOSE: A pattern forming method and a composition for forming a silicon-containing film using the same are provided to suppress the deformation of photo-resist patterns during a dry etching process. CONSTITUTION: A pattern forming method includes the following: a silicon-containing film(20) is formed using a composition for forming a silicon-containing film; a photo-resist film(30) is formed using a resist composition without silicon on the silicon-containing film; the photo-resist film is exposed after heating by high energy beam; the non-exposed part of the photo-resist film is dissolved using the developer of an organic solvent to obtain negative patterns(30a). The composition for forming the silicon-containing film contains at least silicon-containing compound and organic solvent. [Reference numerals] (A) Coating photo-resist; (B) Exposing photo-resist; (C) Developing organic solvent |
申请公布号 |
KR20120105370(A) |
申请公布日期 |
2012.09.25 |
申请号 |
KR20120025846 |
申请日期 |
2012.03.14 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
OGIHARA TSUTOMU;UEDA TAKAFUMI;YANO TOSHIHARU |
分类号 |
G03F7/075;G03F7/00 |
主分类号 |
G03F7/075 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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