发明名称 By-die-exposure for patterning of holes in edge die
摘要 In accordance with the invention, there are semiconductor devices and methods of making semiconductor devices and holes. The method of making a semiconductor device can comprise forming a photoresist layer over a surface of a wafer, wherein the wafer comprises an edge that has a substantially rounded profile, an array of dies, and at least one edge die. The method can also comprise dividing a shot area into a plurality of shot portions and assigning a blind ID to each of the plurality of shot portions. The method can further comprise identifying one or more edge shot portions on the edge of the wafer for additional exposure; and exposing one or more times identified one or more edge shot portions on the edge of the wafer and blocking non-identified one or more non-edge shot portions.
申请公布号 US8273523(B2) 申请公布日期 2012.09.25
申请号 US20060617130 申请日期 2006.12.28
申请人 DETWEILER SHANGTING;CHATTERJEE BASAB;ATKINSON CHRIS D.;GULDI RICHARD L.;TEXAS INSTRUMENTS INCORPORATED 发明人 DETWEILER SHANGTING;CHATTERJEE BASAB;ATKINSON CHRIS D.;GULDI RICHARD L.
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址