发明名称 ULTRAVIOLET (UV)-REFLECTING FILM FOR BEOL PROCESSING
摘要 Semiconductor devices are formed with a dielectric stack by forming an UV reflecting layer between cured and uncured ULK layers during BEOL processing. Embodiments include forming a first ultra low-k (ULK) layer on a semiconductor element, curing the first ULK layer, forming an ultraviolet (UV) reflecting layer on the first ULK layer, forming a second ULK layer on the UV reflecting layer, and irradiating the second ULK layer with UV light.
申请公布号 US2012235304(A1) 申请公布日期 2012.09.20
申请号 US201113051461 申请日期 2011.03.18
申请人 HUISINGA TORSTEN;RICHTER RALF;MAYER ULRICH;GLOBALFOUNDRIES INC. 发明人 HUISINGA TORSTEN;RICHTER RALF;MAYER ULRICH
分类号 H01L23/48;H01L21/28 主分类号 H01L23/48
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