发明名称 SURFACE-EMITTING LASER ELEMENT, ATOMIC OSCILLATOR, AND SURFACE-EMITTING LASER ELEMENT TESTING METHOD
摘要 A disclosed surface-emitting laser element includes a lower DBR formed on a substrate, an active layer formed on the lower DBR, an upper DBR formed on the active layer, a wavelength-adjusting layer formed above the active layer, and a plurality of surface-emitting lasers configured to emit respective laser beams having different wavelengths by changing a thickness of the wavelength-adjusting layer. In the surface-emitting laser element, the wavelength-adjusting layer includes one of a first film having alternately layered GaInP and GaAsP and a second film having alternately layered GaInP and GaAs, the thickness of the wavelength-adjusting layer being changed by partially removing each of the alternating layers of a corresponding one of the first and second films.
申请公布号 WO2012124821(A1) 申请公布日期 2012.09.20
申请号 WO2012JP57250 申请日期 2012.03.14
申请人 RICOH COMPANY, LTD.;SATO, SHUNICHI 发明人 SATO, SHUNICHI
分类号 H01S5/183 主分类号 H01S5/183
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