发明名称 TMR Device with Improved MgO Barrier
摘要 A method of forming a high performance magnetic tunnel junction (MTJ) is disclosed wherein the tunnel barrier includes at least three metal oxide layers. The tunnel barrier stack is partially built by depositing a first metal layer, performing a natural oxidation (NOX) process, depositing a second metal layer, and performing a second NOX process to give a MOX1/MOX2 configuration. An uppermost metal layer on the MOX2 layer is not oxidized until after the MTJ stack is completely formed and an annealing process is performed to drive unreacted oxygen in the MOX1 and MOX2 layers into the uppermost metal layer. In an alternative embodiment, a plurality of metal oxide layers is formed on the MOX1 layer before the uppermost metal layer is deposited. The resulting MTJ stack has an ultralow RA around 1 ohm-μm2 and maintains a high magnetoresistive ratio characteristic of a single metal oxide tunnel barrier layer.
申请公布号 US2012235258(A1) 申请公布日期 2012.09.20
申请号 US201213482017 申请日期 2012.05.29
申请人 ZHAO TONG;WANG HUI-CHUAN;LI MIN;ZHANG KUNLIANG;HEADWAY TECHNOLOGIES, INC. 发明人 ZHAO TONG;WANG HUI-CHUAN;LI MIN;ZHANG KUNLIANG
分类号 H01L29/82 主分类号 H01L29/82
代理机构 代理人
主权项
地址