发明名称 Method for checking e.g. electrical errors in multi-layer arrangements in electronic modules, involves performing thermal radiation measurement at regions of arrangements and temporarily correlating measurement to electrical current signal
摘要 <p>The method involves introducing temporarily and/or partially a cyclically repetitive electrical current signal e.g. sinusoidal current signal, in regions (8-10, 14) of a multi-layer arrangement of an electronic module (6) to be checked. Thermal radiation measurement is performed at the regions of the multi-layer arrangements and temporarily correlated to the signal. The thermal radiation measurement is temporarily and/or partial quasi-punctiformly, temporarily and/or partial quasi-linearly and temporarily and/or partial two-dimensionally performed. The multi-layer arrangement of the electronic modules comprises a base plate (13) and a substrate (12), which is designed as a directly plated-copper substrate, an insulated metal substrate, a directly plated-aluminum substrate and/or a printed circuit board. An independent claim is also included for a thermography device for checking multi-layer arrangements in electronic modules.</p>
申请公布号 DE102011052492(A1) 申请公布日期 2012.09.20
申请号 DE20111052492 申请日期 2011.08.08
申请人 DANFOSS SILICON POWER GMBH 发明人 KOCK, MATHIAS;RUDZKI, JACEK
分类号 G01R31/28;G01R31/26 主分类号 G01R31/28
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