发明名称 |
Method for checking e.g. electrical errors in multi-layer arrangements in electronic modules, involves performing thermal radiation measurement at regions of arrangements and temporarily correlating measurement to electrical current signal |
摘要 |
<p>The method involves introducing temporarily and/or partially a cyclically repetitive electrical current signal e.g. sinusoidal current signal, in regions (8-10, 14) of a multi-layer arrangement of an electronic module (6) to be checked. Thermal radiation measurement is performed at the regions of the multi-layer arrangements and temporarily correlated to the signal. The thermal radiation measurement is temporarily and/or partial quasi-punctiformly, temporarily and/or partial quasi-linearly and temporarily and/or partial two-dimensionally performed. The multi-layer arrangement of the electronic modules comprises a base plate (13) and a substrate (12), which is designed as a directly plated-copper substrate, an insulated metal substrate, a directly plated-aluminum substrate and/or a printed circuit board. An independent claim is also included for a thermography device for checking multi-layer arrangements in electronic modules.</p> |
申请公布号 |
DE102011052492(A1) |
申请公布日期 |
2012.09.20 |
申请号 |
DE20111052492 |
申请日期 |
2011.08.08 |
申请人 |
DANFOSS SILICON POWER GMBH |
发明人 |
KOCK, MATHIAS;RUDZKI, JACEK |
分类号 |
G01R31/28;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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