发明名称 APPARATUS AND METHOD FOR OBSERVING SURFACE STATE
摘要 <P>PROBLEM TO BE SOLVED: To observe a surface state with high precision using a simple and low-cost structure. <P>SOLUTION: An apparatus for observing a surface state comprises: spectral image generating sections 32; gray scale processing sections 33; and wavelength difference calculating sections 41. Each spectral image generating section 32 generates a spectral image by performing correlation operation for an input captured image using each of at least three or more band-pass filters 5 including a solid image having a color code corresponding to spectral characteristics of a different predetermined wavelength. Each gray scale processing section 33 converts the spectral image generated by the spectral image generating section 32 into a gray-scale image. Each wavelength difference calculating section 41 takes a difference of luminance of the gray-scale image converted by the gray scale processing section 33 between adjacent wavelengths to generate a difference image. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012181132(A) 申请公布日期 2012.09.20
申请号 JP20110045029 申请日期 2011.03.02
申请人 DKK TOA CORP 发明人 SHIMADA KOICHI
分类号 G01N21/27 主分类号 G01N21/27
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