发明名称 SPECTRUM MEASURING APPARATUS AND SPECTRUM MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a spectrum measuring apparatus capable of preventing degradation of S/N ratio by delivering a sufficient light volume to imaging means such as an imaging camera, an imaging element, etc. <P>SOLUTION: A spectrum measuring apparatus 1 comprises: a liquid crystal device 2 as a Fourier transform element; a voltage controller 5 for controlling voltage applied to the liquid crystal device 2; and an imaging device 3 for imaging a transmittance waveform of a measuring object 7 passing through the liquid crystal device 2. A computer 4 executes: a step for storing data about images taken while controlling the voltage applied to the liquid crystal device 2 so that a wave number included in the transmittance waveform after passage through the liquid crystal device 2 has a non-integral multiple relationship; a step for calculating a Fourier component of integral multiple frequency for each pixel in a measurement interval by solving a simultaneous equation based on the multiple pieces of image data which differ in the wave number; and a step for calculating an optical spectrum for each pixel by applying inverse Fourier transform to the calculated Fourier component of integral multiple frequency in each pixel. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012181086(A) 申请公布日期 2012.09.20
申请号 JP20110043757 申请日期 2011.03.01
申请人 21 AOMORI SANGYO SOGO SHIEN CENTER 发明人 SEKIYA KAZUO;MURAI HIROSHI;WAKAO KAZUHIRO
分类号 G01J3/447;G01J3/36 主分类号 G01J3/447
代理机构 代理人
主权项
地址