| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing device in which a test program may be efficiently created, modified and corrected. <P>SOLUTION: A semiconductor testing device comprises: an editor that has a display part for displaying a screen provided with a tab for selecting a desired screen and is used for creating/modifying/correcting a test program; a parser part for analyzing the test program created/modified/corrected by the editor; a GUI screen editing part for editing/creating a GUI screen of various kinds of matrix formats on the basis of an analysis result of the parser part; and an indexer for creating a data retrieval list on the basis of the analysis result of the parser part and the GUI screen edited/created by the GUI screen editing part and storing the list. Respective intersections of the matrix format of the GUI screen are linked with components of the test program through the data retrieval list of the indexer. <P>COPYRIGHT: (C)2012,JPO&INPIT |
