发明名称 HEAT TREATMENT METHOD AND HEAT TREATMENT APPARATUS FOR HEATING SUBSTRATE BY IRRADIATING SUBSTRATE WITH FLASH OF LIGHT
摘要 The first flash irradiation is performed on a semiconductor wafer preheated to 500° C. to heat a front surface of the semiconductor wafer. Thereafter, the second flash irradiation is performed to reheat the front surface of the semiconductor wafer before the temperature of the front surface of the semiconductor wafer becomes equal to the temperature of a back surface of the semiconductor wafer. Thus, the second flash irradiation is performed before the temperature of the front surface of the semiconductor wafer falls. Even if less energy is consumable by the second flash irradiation, the efficiency of heating of the front surface of the semiconductor wafer resulting from each iteration of the flash irradiation is improved.
申请公布号 US2012238110(A1) 申请公布日期 2012.09.20
申请号 US201213366414 申请日期 2012.02.06
申请人 YOKOUCHI KENICHI 发明人 YOKOUCHI KENICHI
分类号 H01L21/263;F27D11/00 主分类号 H01L21/263
代理机构 代理人
主权项
地址
您可能感兴趣的专利