发明名称 INSPECTION MODE SWITCHING CIRCUIT
摘要 An eddy current probe testing apparatus structured to operate concurrently in a driver pick-up mode and said impedance mode is provided. The eddy current probe has two coils. The eddy current probe testing apparatus also includes a signal producing device, an output device, and a switch assembly. The switch assembly is structured to switch how an input signal from the signal producing device is provided to the two coils. Thus, an inspection may be performed in two modes concurrently.
申请公布号 US2012235675(A1) 申请公布日期 2012.09.20
申请号 US201213482251 申请日期 2012.05.29
申请人 NENNO THOMAS W.;JUNKER WARREN R.;NOVOTNY RICHARD M.;WYFFELS CONRAD S.;WESTINGHOUSE ELECTRIC COMPANY LLC 发明人 NENNO THOMAS W.;JUNKER WARREN R.;NOVOTNY RICHARD M.;WYFFELS CONRAD S.
分类号 G01N27/90 主分类号 G01N27/90
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