发明名称 |
PHOTORESIST COMPOSITION AND METHOD OF FORMING PHOTOLITHOGRAPHIC PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a photoresist composition useful in forming fine patterns using negative tone development processes and a method of forming photolithographic patterns. <P>SOLUTION: A photoresist composition comprises: a first polymer comprising units of the following formulas (I), (II) and (III); a second polymer comprising units of the following formulas (IV) and (V); and a photoacid generator. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012181524(A) |
申请公布日期 |
2012.09.20 |
申请号 |
JP20120039718 |
申请日期 |
2012.02.27 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS LLC |
发明人 |
YANG CHOL-BAE;JEON KUN-BAK;LEE SUN-HYON;LIU YI;CARDOLACCIA THOMAS;ROSEMARY BELL |
分类号 |
G03F7/039;C08F220/28;G03F7/038;G03F7/32;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|