发明名称 PHOTORESIST COMPOSITION AND METHOD OF FORMING PHOTOLITHOGRAPHIC PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a photoresist composition useful in forming fine patterns using negative tone development processes and a method of forming photolithographic patterns. <P>SOLUTION: A photoresist composition comprises: a first polymer comprising units of the following formulas (I), (II) and (III); a second polymer comprising units of the following formulas (IV) and (V); and a photoacid generator. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012181524(A) 申请公布日期 2012.09.20
申请号 JP20120039718 申请日期 2012.02.27
申请人 ROHM & HAAS ELECTRONIC MATERIALS LLC 发明人 YANG CHOL-BAE;JEON KUN-BAK;LEE SUN-HYON;LIU YI;CARDOLACCIA THOMAS;ROSEMARY BELL
分类号 G03F7/039;C08F220/28;G03F7/038;G03F7/32;H01L21/027 主分类号 G03F7/039
代理机构 代理人
主权项
地址