发明名称 SEMICONDUCTOR HAVING A HIGH ASPECT RATIO VIA
摘要 The present disclosure provides various embodiments of a via structure and method of manufacturing same. In an example, a via structure includes a via having via sidewall surfaces defined by a semiconductor substrate. The via sidewall surfaces have a first portion and a second portion. A conductive layer is disposed in the via on the first portion of the via sidewall surfaces, and a dielectric layer is disposed on the second portion of the via sidewall surfaces. The dielectric layer is disposed between the second portion of the via sidewall surfaces and the conductive layer. In an example, the dielectric layer is an oxide layer.
申请公布号 US2012235300(A1) 申请公布日期 2012.09.20
申请号 US201213481574 申请日期 2012.05.25
申请人 HSIEH YUAN-CHIH;CHU RICHARD;WU MING-TUNG;LIU MARTIN;CHAO LAN-LIN;TSAI CHIA-SHIUNG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSIEH YUAN-CHIH;CHU RICHARD;WU MING-TUNG;LIU MARTIN;CHAO LAN-LIN;TSAI CHIA-SHIUNG
分类号 H01L23/48 主分类号 H01L23/48
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